Search Results - jon+johnson

2 Results

Sort By:

Methodology for Determination of Trap Depth and Energy by Single Electron / Dynamic Tunneling Force Spectroscopy

Invention Description: Researchers at University of Utah have developed an additional methodology that has been developed that relates to newly developed atomic scale imaging and spectroscopic techniques, Single Electron Tunneling Force Microscopy/ Spectroscopy (SETFM/S) and Dynamic Tunneling Force Microscopy/ Spectroscopy (DTFM/S). the invention...

Published: 8/3/2017 | Inventor(s): Clayton Williams, Jon Johnson

Keywords(s):

Category(s): Microscopy

Method to Measure Depth and Energy of Electronic States by Tunneling Force Microscopy

Invention Description: Electronic trap states in dielectric materials critically influence the reliability and performance of electronic devices. Researchers at The University of Utah have developed a technique to characterize such states with atomic scale spatial resolution. The method is based on tunneling charge measurements, which are performed...

Published: 6/6/2019 | Inventor(s): Clayton Williams, Jon Johnson

Keywords(s):

Category(s): Microscopy, Instrumentation