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Polarization-Modulated Tip Enhanced Optical Microscope

Invention Description: Tip enhanced optical microscopy is a method to improve the spatial resolution of conventional optical microscopy from ~250nm to ~10nm. The method relies on the enhancement of the optical intensity which can occur at the apex of a sharp probe, such as the tip of an atomic force microscope (AFM) probe, when a laser with appropriate...

Published: 2/6/2020 | Inventor(s): Jordan Gerton

Keywords(s): Instrumentation, Research Tools & Reagents

Category(s): Research Tools & Reagents, Instrumentation